R Satheeskumar. Variation-Aware VLSI Design Methodology for Reliable Nanoscale CMOS Circuits. National Journal of Advanced VLSI Design and Systems [Internet]. 2026 Jan. 17 [cited 2026 Jul. 30];1(1):125-32. Available from: https://iaeces.com/Index/index.php/NJAVDS/article/view/194